Application no. and date | 19185162.5 (espacenet) (Federated) (European Patent Register), 20120413 | Patent/reg. no. and date | DK/EP 3575796, 20201111 | Publication date | 20191204 | Priority no. and date | US 201161476145 P, 20110415 | EP pub. no. and date |
EP 3575796 20191204 | Effective date | | Applicant/owner | DexCom, Inc., 6340 Sequence Drive
San Diego, CA 92121, US | Applicant ref. no. | P75169DK01 | Inventor | RONG, Daiting, 4766 Caminito Impersado
San Diego, CA 92130, US, Kamath, Apurv, 3524 Chasewood Drive
San Diego, CA 92111, US, BOHM, Sebastian, 5075 Fallenwood Lane
San Diego, CA 92121, US, Simpson, Peter C., 227 N. Vulcan Avenue
Encinitas, CA 92024, US, Estes, Michael J., 14537 Crestline Drive
San Diego, CA 92064, US | Representative | Plougmann Vingtoft A/S, Strandvejen 70, 2900 Hellerup, DK | Opponent | | IPC Class | A61B 5/157 (2006.01) , G01N 33/66 (2006.01) | Title | AVANCERET ANALYTSENSORKALIBRERING OG FEJLDETEKTION | Int. application no. | | Int. publication no. | | Related patent (certificate) | | Status | Ophævet | Pædiatrisk forlængelse | - | Udløbsdato for pædiatrisk forlængelse | - |
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